GI20干涉仪

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• 更新时间：2016-04-19

产品简介：

The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm （6"）Ø.

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The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm (6”)Ø. Unlike conventional fizeau interferometers, the GI20 can measure

non-reflective surfaces, ideal for analysing lapped and/or ground surfaces prior to final polishing. The interferogram is displayed on a LCD screen on the front of the unit.

• High precision flatness measurement of ground, lapped or semi-polished samples

• Measure 2μm per fringe with excellent clarity

• Surface roughness measurement from 1nm to 300nm Ra