网站首页|在线留言|联系我们

欢迎来到北京华沛智同科技发展有限公司

北京华沛智同科技发展有限公司

全国服务热线:010-82630761
北京华沛智同科技发展有限公司

GI20干涉仪

  • 浏览次数:1930
  • 更新时间:2016-04-19
产品简介:

The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm (6")Ø.

分享到:

The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm (6”)Ø. Unlike conventional fizeau interferometers, the GI20 can measure

non-reflective surfaces, ideal for analysing lapped and/or ground surfaces prior to final polishing. The interferogram is displayed on a LCD screen on the front of the unit.

• High precision flatness measurement of ground, lapped or semi-polished samples

• Measure 2μm per fringe with excellent clarity

• Surface roughness measurement from 1nm to 300nm Ra

留言框

  • 产品:

  • 您的单位:

  • 您的姓名:

  • 联系电话:

  • 常用邮箱:

  • 省份:

  • 详细地址:

  • 补充说明:

  • 验证码:

    请输入计算结果(填写阿拉伯数字),如:三加四=7

点击这里给我发消息